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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Format Post in Engineering BY Y. Sun, Yichuang Sun

0863417450 Shared By Guest

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach Y. Sun, Yichuang Sun is available to download <table><tr><td colspan="2"><strong style="font-size:1.This material is available do download at niSearch.com on Y. Sun, Yichuang Sun's eBooks, 2em;">Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach</strong><br/>Y.Test and Diagnosis of ... Textbook Sun, Yichuang Sun</td></tr> <tr> <td><b>Type:</b></td> <td>eBook</td> </tr> <tr> <td><b>Released:</b></td> <td>2007</td> </tr> <tr> <td><b>Publisher:</b></td> <td>IET</td> </tr> <tr> <td><b>Page Count:</b></td> <td>411</td> </tr> <tr> <td><b>Format:</b></td> <td>pdf</td> </tr> <tr> <td><b>Language:</b></td> <td>English</td> </tr> <tr> <td><b>ISBN-10:</b></td> <td>0863417450</td> </tr> <tr> <td><b>ISBN-13:</b></td> <td>9780863417450</td> </tr> </table> This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students. About the Author Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

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