Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach Y. Sun, Yichuang Sun is available to download
|Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach|
Y.Test and Diagnosis of ... Textbook Sun, Yichuang Sun
|Type: ||eBook |
|Released: ||2007 |
|Publisher: ||IET |
|Page Count: ||411 |
|Format: ||pdf |
|Language: ||English |
|ISBN-10: ||0863417450 |
|ISBN-13: ||9780863417450 |
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
About the Author
Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.