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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Format Post in Engineering BY Y. Sun, Yichuang Sun

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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach Y. Sun, Yichuang Sun is available to download

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
Y.Test and Diagnosis of ... Textbook Sun, Yichuang Sun
Type: eBook
Released: 2007
Publisher: IET
Page Count: 411
Format: pdf
Language: English
ISBN-10: 0863417450
ISBN-13: 9780863417450
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students. About the Author Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

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