Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach Y. Sun, Yichuang Sun is available to download

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach Y.Test and Diagnosis of ... Textbook Sun, Yichuang Sun
Type:	eBook
Released:	2007
Publisher:	IET
Page Count:	411
Format:	pdf
Language:	English
ISBN-10:	0863417450
ISBN-13:	9780863417450

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students. About the Author Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.