Microwave Scattering and Emission Models for Users

Format Post in Engineering BY Adrian K. Fung, K. S. Chen

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Microwave Scattering and Emission Models for Users Adrian K. Fung, K. S. Chen is available to download

Microwave Scattering and Emission Models for Users
Adrian K.Microwave Scattering and Emission ... Textbook Fung, K. S. Chen
Type: eBook
Released: 2009
Publisher: Artech House Publishers
Page Count: 446
Format: pdf
Language: English
ISBN-10: 1608070379
ISBN-13: 9781608070374
Today, microwave remote sensing has evolved into a valuable and economical tool for a variety of applications. It is used in a wide range of areas, from geological sensing, geographical mapping, and weather monitoring, to GPS positioning, aircraft traffic, and mapping of oil pollution over the sea surface. This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models to their specific work in the field. CD-ROM Included! It contains Mathematica code for all the scattering and emission models presented the book, so practitioners can easily use the models for their own applications. About the Author Adrian K. Fung most recently served as the director of the Wave Scattering Research Center, a professor of electrical engineering, and a member of the Academy of Distinguished Scholars at the University of Texas at Arlington. He is also the author of Microwave Scattering and Emission Models and Their Applications (Artech House, 1994) and has coauthored and contributed to several other books in the field. Dr. Fung received his Ph.D. from the University of Kansas. Kun-Shan Chen is the director of the Communications Research Center and holds the distinguished chair professorship at the National Central University in Chung-Li, Taiwan. He is an associate editor of the IEEE Transactions on Geoscience and Remote Sensing and serves as the deputy editor-in-chief of the IEEE J-Star.

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